Fritsch Laser-Particle Measurement Analysette 22

25 Years Laser-Technology

In 1985 FRITSCH revolutionised measurement precision by introducing laser diffraction in a convergent laser beam with the patented FRITSCH measurement process. The advantage of this patented FRITSCH measuring method is a simple continuous adjustment of the measuring area as well as up to now unknown number of measuring channels. With the different systems COMPACT, MicroTec, MicroTec XT and NanoTec and the possibility to combine corresponding components, it is possible to configure a measurement system that is precisely adapted to special needs, with reliability and efficiency guaranteed by...

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Inexpensive and with a unique measuring range from 0.01 – 3800 µm

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